发明名称 CENTRALIZED TEST SYSTEM
摘要 PURPOSE:To simplify the constitution of a test board and also to attain economical test of plural exchange stations by providing a digital link distributing a channel between a PCM line and plural test boards and switching a roue to a substitute route if a fault takes place in a test route to conduct the test of an exchange station. CONSTITUTION:When the state with no response from a terminal station takes place or fault information is transmitted from a gate station TS0, a switching command of the test route is fed from, e.g., a test board MLTCNS0 to a controller CTL. Thus, the controller CTL controls a digital link DLIC to attain switching control from the test route via the gate station TS0 to the test route via a gate station TS1 represented in dotted lines. Since the test boards MLTCNS0, MLTCNS1,...MLTCNSn are connected to terminal stations LS0, LS1,...LSm in the route of the gate station TS1 in dotted lines, even if a fault takes place in the gate station TS0, the test of the terminal stations LS0, LS1,... LSm is conducted.
申请公布号 JPS60150368(A) 申请公布日期 1985.08.08
申请号 JP19840005739 申请日期 1984.01.18
申请人 FUJITSU KK 发明人 YOKOTO TAKASHI;KOUNO HISAO
分类号 H04M3/26;H04M3/24 主分类号 H04M3/26
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