发明名称 TEMPERATURE TESTING METHOD
摘要 PURPOSE:To perform high temp. burning-in, by providing a partition plate to a shelf having a printed circuit board therein and attaining to raise the temp. in the shelf by heat generated from the semiconductor element monted to the printed circuit board by driving the fan of a fan unit. CONSTITUTION:A shelf 8 is constituted so that a printed circuit board 6 having a plurality of semiconductor elements 13 mounted thereto is received in a detachable manner and the open air is taken in from the direction shown by the arrow C by driving the fan 11 of a fan unit 10 and exhausted from the direction shown by the arrow D to cool the elements 13. Partititon plates 14 are respectively provided to surfaces above and below the mounting boundary of the shelf 8 and other machineries to form a predetermined space and a plurality of fans 11-1-11-4 provided in opposed relation to upper and lower surfaces of the shelf 8 so as to recirculate heat generated from the elements 13 secured to the printed circuit board 12 are driven to send out air to directions E1, E2...E6 and an electronic apparatus is operated. Whereupon, the temp. in the shelf 8 rises and high temp. burning-in can be carried out.
申请公布号 JPS60143792(A) 申请公布日期 1985.07.30
申请号 JP19830248429 申请日期 1983.12.29
申请人 FUJITSU KK 发明人 MIYAGAWA TOSHIE
分类号 G01R31/28;G01R31/30 主分类号 G01R31/28
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