| 摘要 |
Apparatus for measuring reflected or transmitted light is described. The apparatus comprises filter type spectrophotometer having a wavelength range of from about 200 nm (nanometers) to about 1,100 nm which includes a sample illuminating light source capable of producing an extremely intense light of short duration; light diffusing means; a light filter for transmission of a selected wave-length; at least two independent light sensing means; and separate means defining light transmission paths for the passage of light from the light source to one light sensing means and from the illuminated sample to the other light sensing means. |
