发明名称 FORMATION OF RESIST MICROPATTERN
摘要 PURPOSE:To form an impenetrable finely roughened sharp resist pattern by coating a substrate with a polyfluoroalkyl-alpha-chloroacrylate homo- or co-polymer, irradiating radiation to form a pattern, and heat developing it up to the glass transition point of the polymer. CONSTITUTION:The polyfluoroalkyl-alpha-chloroacrylate homo- or co-polymer to be used here is a homopolymer or comonomer of a monomer represented by the formula shown on the right, R being a 2-10C alkyl group substd. by at least one F atom at the >=2-position. The substrate is coated with such a polymer to form a resist film, and it is patternwise excessively exposed to radiation rays, such as electron beams, X-rays, or far UV rays to form a pattern, and heat developed at a temp. below the glass transition point of the used polymer.
申请公布号 JPS61193147(A) 申请公布日期 1986.08.27
申请号 JP19850032821 申请日期 1985.02.22
申请人 TORAY IND INC 发明人 KATAOKA MUTSUO
分类号 G03F7/36;G03C5/18;G03F7/30 主分类号 G03F7/36
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