| 摘要 |
PURPOSE:To increase the test processing speed with simple and miniature constitution by collating the total value of storage data with the total value of the expected value data and deciding the nondefective and defective states with coincidence and discordance of the comparison respectively. CONSTITUTION:A totalizer 17 adds successively the data on the ROM to be measured which are obtained by giving access to each memory cell of a ROM11 to be measured and delivers the result of totalization to a comparison deciding device 15. While a check sum circuit 18 stores the total value of data on the ROM to be measured as the expected value and delivers it to the device 15. The device 15 decides whether the total value N is equal to the expected value S and displays the nondefective and defective states the coincidence and discordance are obtained between both values N and S respectively. Simple and miniature constitution is possible for a ROM tester since it compares only the value N with the value S. This device can increase the test processing time. |
