发明名称 Procédé et montage pour l'assemblage mécanique de diodes à cristal et pièces ainsi fabriquées.
摘要 <PICT:0950737/C1/1> <PICT:0950737/C1/2> <PICT:0950737/C1/3> <PICT:0950737/C1/4> In a method of assembling a crystal diode, Fig. 1, an anode portion (1, 3) is held, under the action of an automatically reproducible and automatically applied force P, with its whisker 3 against the semi-conductor crystal 4 of a cathode portion 2, 4, 5, the electrical properties of the contact are tested; and, if the result is favourable, the open end of the glass bulb 5 is sealed to the end of the wire 1 whilst the whisker is held against the crystal by that force. If the result is unfavourable, the anode portion is raised, rotated about its longitudinal axis and lowered to form a new contact which is tested as before. A device, Fig. 5, for carrying out this method has sealing heads located along, say, a straight line, Fig. 5, in a circle around which they are moved in synchronism with the motion of parts on guide tracks 42, 43. Anode and cathode portions are supplied by arms at s and t along paths 48, 49; and completed diodes are removed along paths 50, 51. A safety device in zone D prevents supply if any sealing head is not emptied. Each sealing head, Fig. 2, comprises tongs 7, which hold the cathode portion, and a holder 6, with a magnetic part 12, for the anode portion. A slidable rod 16 with a magnetic end 17 is movable vertically to displace the anode portion and is allowed to fall freely in the application of the force. The end 17 of rod 16 may be replaced by a weight 33, Fig. 3, in which a magnetic block is slidable under the action of a compression spring. An electrical heating coil 14 is movable vertically over the cathode portion. Electrical tests of the contact are made via leads 18, 19, in the adjusting zone A, Fig. 5, of the machine, the two portions being moved together at b, the electrical properties tested at c and readjustment and renewed testing carried out, if necessary, at e, f, g, h, electromagnetic means terminating adjustment when the contact is correct. If the contact is incorrect at k, the tongs open at m; and the cathode portion is released and falls out of the tongs. Heating coil 14 is energized to seal the diode in zone B and the diode is cooled in zone C before removal at n or r in zone D.
申请公布号 OA795(A) 申请公布日期 1967.11.15
申请号 OA19640050886 申请日期 1964.12.16
申请人 N.V. PHILIPS'GLOEILAMPENFABRIEKEN 发明人
分类号 H01J9/32;H01L21/00;H01L23/04;H01L29/00;(IPC1-7):H05G1/56 主分类号 H01J9/32
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