发明名称 |
Extrusion die and process for thickness control |
摘要 |
An improved extrusion die employing proximity sensors to directly measure the actual die gap during extrusion is disclosed. The proximity sensor may be a capacitance-effect, or optical-effect sensor. Manual and automated closed-loop methods of operation are also disclosed.
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申请公布号 |
US4517145(A) |
申请公布日期 |
1985.05.14 |
申请号 |
US19830549097 |
申请日期 |
1983.11.07 |
申请人 |
AMERICAN HOECHST CORPORATION |
发明人 |
KNOPF, WILLIAM H. |
分类号 |
B29C47/16;B29C47/92;(IPC1-7):B29D7/22 |
主分类号 |
B29C47/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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