发明名称 Extrusion die and process for thickness control
摘要 An improved extrusion die employing proximity sensors to directly measure the actual die gap during extrusion is disclosed. The proximity sensor may be a capacitance-effect, or optical-effect sensor. Manual and automated closed-loop methods of operation are also disclosed.
申请公布号 US4517145(A) 申请公布日期 1985.05.14
申请号 US19830549097 申请日期 1983.11.07
申请人 AMERICAN HOECHST CORPORATION 发明人 KNOPF, WILLIAM H.
分类号 B29C47/16;B29C47/92;(IPC1-7):B29D7/22 主分类号 B29C47/16
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