发明名称 Contact sensing probe for a measuring apparatus
摘要 A coordinate measuring machine probe of the type including an arrangement for detecting contact with a surface, in which a light source and a plurality of photocells are arranged to generate an electrical signal upon probe pivoting motion by detection changes in light intensity sensed by the photodetectors. A summing circuit measures the total incident illumination of the photocells and controls the light source to maintain the total illumination of the photocells to be constant.
申请公布号 US4513507(A) 申请公布日期 1985.04.30
申请号 US19830528827 申请日期 1983.09.02
申请人 BENDIX AUTOMATION COMPANY 发明人 LASKOWSKI, EDWARD L.
分类号 G01B7/012;G01B11/00;(IPC1-7):G01B11/24 主分类号 G01B7/012
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