发明名称 |
Contact sensing probe for a measuring apparatus |
摘要 |
A coordinate measuring machine probe of the type including an arrangement for detecting contact with a surface, in which a light source and a plurality of photocells are arranged to generate an electrical signal upon probe pivoting motion by detection changes in light intensity sensed by the photodetectors. A summing circuit measures the total incident illumination of the photocells and controls the light source to maintain the total illumination of the photocells to be constant.
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申请公布号 |
US4513507(A) |
申请公布日期 |
1985.04.30 |
申请号 |
US19830528827 |
申请日期 |
1983.09.02 |
申请人 |
BENDIX AUTOMATION COMPANY |
发明人 |
LASKOWSKI, EDWARD L. |
分类号 |
G01B7/012;G01B11/00;(IPC1-7):G01B11/24 |
主分类号 |
G01B7/012 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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