发明名称 POLYCRYSTALLINE SILICON RESISTOR
摘要 An improved polycrystalline silicon resistor having limited lateral diffusion, integrated circuits containing such resistors, and a method of their preparation is disclosed. The polysilicon resistor is formed by first doping the polysilicon layer with a p or n type impurity and thereafter neutralizing the treated layer with impurities of the other type so as to form a device wherein the concentration gradient between the resistor region of the aforesaid layer and its environment is low. The low concentration gradient reduces lateral diffusion during manufacture, thereby permitting manufacture of integrated circuits of higher circuit density and resistors with smaller dimensions, lower temperature coefficients and higher reliability.
申请公布号 JPS6074465(A) 申请公布日期 1985.04.26
申请号 JP19840112925 申请日期 1984.06.01
申请人 EREKUTORONIKUSU RESEARCH ANDO SERVICE OOGANIZEESHIYON IND TEKUNOROJII RESEARCH INST 发明人 MINGUUKUWANGU RII
分类号 H01L27/04;H01L21/02;H01L21/20;H01L21/324;H01L21/822;H01L27/11 主分类号 H01L27/04
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