发明名称 Apparatus for thermal treatment of semiconductor wafers by gas conduction incorporating peripheral gas inlet
摘要 An apparatus for the uniform thermal treatment of semiconductor wafers by gas conduction holds the wafer in place over a gas filled cavity in opposition to a thermal mass maintained at an appropriate temperature. Gas is introduced behind the semiconductor wafer adjacent its periphery to produce a near-constant gas pressure across the backside of the wafer. The constant pressure produces constant thermal conductivity. Consequently, heat conduction is uniform, the temperature of the wafer is uniform and uniform processing is accomplished across the wafer.
申请公布号 US4512391(A) 申请公布日期 1985.04.23
申请号 US19820343794 申请日期 1982.01.29
申请人 VARIAN ASSOCIATES, INC. 发明人 HARRA, DAVID J.
分类号 B01J3/00;C30B25/10;C30B25/12;C30B31/14;H01L21/265;H01L21/302;H01L21/3065;(IPC1-7):F28F7/00;F28D15/00 主分类号 B01J3/00
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