发明名称 |
PATTERN INSPECTING APPARATUS |
摘要 |
PURPOSE:To attain to enhance the reliability in inspection, by preliminarily storing the detection signal of the pattern of a comparing object in memory and comparing the detection signal of a pattern to be inspected with the content of the memory. CONSTITUTION:A specimen 1 is moved to a direction at right angles to a linear image sensor scanning direction by an X-Y table 8 to detect a two-dimensional pattern. The output of a linear image sensor 5a is binarized by a binarizing circuit 6a. The output of this binarizing circuit 6a is divided into two and one of them is inputted to a discriminating circuit 7 while the other one is inputted to a shift register 9. The output of the shift register 9 is inputted to the discriminating circuit 7 and compared with the output of the binarizing circuit 6a to perform discrimination and a non-coincidence part is judged as a defect. |
申请公布号 |
JPS6061604(A) |
申请公布日期 |
1985.04.09 |
申请号 |
JP19830169168 |
申请日期 |
1983.09.16 |
申请人 |
HITACHI SEISAKUSHO KK |
发明人 |
FUSHIMI SATOSHI;HARA YASUHIKO;MAKIHIRA HIROSHI;OOSHIMA YOSHIMASA |
分类号 |
G01N21/88;G01B11/24;G01N21/956 |
主分类号 |
G01N21/88 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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