发明名称 |
Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs |
摘要 |
An integrated circuit is tested by applying to it the output of a clocked word generator. The resulting output from the circuit is analyzed by a phase sensitive detector comprising a series of sampling switches and integrators which are synchronized with the generator frequency. The output spectrum is compared with that of a reference to evaluate the quality of the circuit.
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申请公布号 |
US4506212(A) |
申请公布日期 |
1985.03.19 |
申请号 |
US19800173743 |
申请日期 |
1980.07.30 |
申请人 |
THE POST OFFICE |
发明人 |
MELIA, ALAN J. |
分类号 |
G01R31/30;G01R31/3193;G06F11/277;(IPC1-7):G01R15/12;G01R27/00 |
主分类号 |
G01R31/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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