发明名称 APPARATUS FOR MEASURING STRESS WITH X-RAYS
摘要 PURPOSE:To improve measuring accuracy by disassembling and taking out only an X- ray tube and an X-ray detector, attaching the same to a holding base and making the X-ray tube and X-ray detector independently movable around one point O so that relatively easy installation is made possible in a narrow part as well thereby enabling measurement of the stress existing internally in a test piece 1 attached to a material tester and permitting desired change of the incident angle to the test piece 1. CONSTITUTION:A test piece 1 is attached to a rod 2 and, after a protective pipe 3 is assembled, subjected to tensile strength or compressive strength. X-rays are irradiated from an X-ray tube 7 toward one point O of the test piece 1 and the diffracted X-rays reflected by the surface of the test piece 1 are made incident on an X-ray detector 9. The detector 9 is movable along a guide track 5 disposed around the point O of the test piece 1 and therefore if a max. position is determined by observing the relation between the angle position and the intensity of the diffracted X-rays detected by said detector, the stress existing internally in the test piece 1 is measured. On the other hand if a substantial change is not found in the intensity of the diffracted X-rays, a holding base 6 is moved along the track 5 to change the incident angle while the X-ray tube 7 is always directed to the point O, by which the stress is measured.
申请公布号 JPS6036943(A) 申请公布日期 1985.02.26
申请号 JP19830144656 申请日期 1983.08.08
申请人 MITSUBISHI JUKOGYO KK 发明人 UEHARA KATSUKAGE;MATSUMOTO TATSUYOSHI
分类号 G01L1/00;G01N23/207 主分类号 G01L1/00
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