发明名称 A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, AND A DEVICE SO MANUFACTURED
摘要 The method provides for the simultaneous formation of diffused regions (14a, 14b) with different diffusion depths. A polycrystalline semiconductor layer (11), different parts of which are of different thicknesses, is formed on the surface of a semiconductor substrate (1) on which a diffusion mask (7) with diffusion windows (8, 9 and 10) is formed. By impurity diffusion from the surface of the polycrystalline semiconductor layer (11) a comparatively shallow diffused region (14b) and a comparatively deep diffused region (14a) are formed in a single diffusion process, respectively under a comparatively thick part of the polycrystalline semiconductor layer and a comparatively thin part of the polycrystalline semiconductor layer.
申请公布号 DE3168092(D1) 申请公布日期 1985.02.21
申请号 DE19813168092 申请日期 1981.02.18
申请人 VLSI TECHNOLOGY RESEARCH ASSOCIATION 发明人 NAWATA, KAZUMASA;SUZUKI, HIROKAZU
分类号 H01L21/225;H01L29/08;(IPC1-7):H01L21/22;H01L21/265 主分类号 H01L21/225
代理机构 代理人
主权项
地址