发明名称 |
A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE, AND A DEVICE SO MANUFACTURED |
摘要 |
The method provides for the simultaneous formation of diffused regions (14a, 14b) with different diffusion depths. A polycrystalline semiconductor layer (11), different parts of which are of different thicknesses, is formed on the surface of a semiconductor substrate (1) on which a diffusion mask (7) with diffusion windows (8, 9 and 10) is formed. By impurity diffusion from the surface of the polycrystalline semiconductor layer (11) a comparatively shallow diffused region (14b) and a comparatively deep diffused region (14a) are formed in a single diffusion process, respectively under a comparatively thick part of the polycrystalline semiconductor layer and a comparatively thin part of the polycrystalline semiconductor layer. |
申请公布号 |
DE3168092(D1) |
申请公布日期 |
1985.02.21 |
申请号 |
DE19813168092 |
申请日期 |
1981.02.18 |
申请人 |
VLSI TECHNOLOGY RESEARCH ASSOCIATION |
发明人 |
NAWATA, KAZUMASA;SUZUKI, HIROKAZU |
分类号 |
H01L21/225;H01L29/08;(IPC1-7):H01L21/22;H01L21/265 |
主分类号 |
H01L21/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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