发明名称 METHOD FOR INSPECTING FLAW OF ELECTRONIC PARTS
摘要 PURPOSE:To detect a flaw in an extremely easy manner, by a method wherein the required part of an upper conductor in electronic parts is removed to expose a cloth structural insulating part and, after a water droplet was dripped, DC voltage is applied between upper and lower conductors. CONSTITUTION:The upper conductor 4 in electronic parts such as a thick film hybrid board is removed by a grinding means such as sand blast 10 to expose cloth glass 3 of a lower layer. The whole is immersed in a solder tank 11 and the conductor 4 still remaining is removed in a state caught by solder. Subsequently, a water droplet 13 is dripped on the cloth glass 12 and DC bias voltage is applied between upper and lower conductors 2, 4. Then, by observing the generation of continuous air bubbles 13 or metal migration 14 extending in a dendrite form, flaw detection is performed. By this method, a piercing flaw or the lowering in insulating resistance can be detected by an extremely simple method.
申请公布号 JPS61269055(A) 申请公布日期 1986.11.28
申请号 JP19850111432 申请日期 1985.05.22
申请人 MITSUBISHI ELECTRIC CORP 发明人 ITO MASAAKI;IKEDA YASUKI;IKEO HIROBUMI
分类号 H05K3/46;G01N27/20;H05K3/00 主分类号 H05K3/46
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