| 摘要 |
PURPOSE:To obtain optimum control sensitivity by setting a testing device to the optimum control sensitivity automatically and cope with measurements various material waveforms. CONSTITUTION:A set signal generation part 16 is connected to the front stage of a servoamplifier 17 at the input side of a testing machine body 10, and outputs a shift wave A with a level which is low enough not to exert influence upon a test material as a preliminary test so as to adjust the sensitivity of the testing device. This shift wave A is inputted as a measurement signal to a CPU14 by being passed through the testing machine body 10, etc., but arithmetic processed by the CPU14 on the basis of a detection signal B which is stored in a memory 15 and consists of the 1st and the 2nd bands X and Y so as to decides on a state change which occurs when the signal is passed through the testing device. Then, a decision on the control sensitivity of the testing device is made by said arithmetic processing with regard to dynamic characteristics and static characteristics separately; and a correcting signal is outputted to the servoamplifier 17 which sends an operation signal to the testing machine body 10 only when it is decided totally that the control sensitivity is ''defective''. |
