发明名称 SEMICONDUCTOR LIGHT EMISSION ELEMENT AND MANUFACTURE OF THE SAME
摘要 <p>PURPOSE:To obtain a semiconductor light emission element with a high external quantum efficiency, a high output, a high mass-producibility and a simple manufacturing process by a method wherein the semiconductor light emission element is a surface light emmission type semiconductor element which outputs a light to the direction perpendicular to the main surface of a semiconductor multi-layer film and a high refractive index semiconductor crystal layer which has a light converging function is formed on the light output surface of the element. CONSTITUTION:A P-type InP buffer layer 12, a P-type InGaAsP activation layer 13, an N-type InP cladding layer 14, an undoped InGaAs etching stopper layer 15, an N-type InP layer 16, an undoped InGaAsP etching stopper layer 17 and an N-type InP layer 18 are made to grow on a P-type InP substrate 11 by a liquid phase epitaxial method. After an SiO2 etching mask film 19 is deposited and a recessed part 20 is formed, an In1-xGaxAsyP1-y (wherein x=0.18, y=0.39) buried layer 21 is formed as a high refractive index semiconductor crystal layer and a smooth convex lens surface 22 is formed with methanol bromide. After the etching mask film 19 is removed, an N-type electrode 23 is evaporated and, further, a P-type electrode 24, an SiO2 insulation film 25 and a plated heat sink (PHS) 26 are formed to complete the element.</p>
申请公布号 JPS61280686(A) 申请公布日期 1986.12.11
申请号 JP19850121407 申请日期 1985.06.06
申请人 TOSHIBA CORP;TOSHIBA ELECTRON DEVICE ENG CORP 发明人 TANAKA AKIRA;MATSUYAMA TAKAYUKI
分类号 H01L21/302;H01L33/14;H01L33/20;H01L33/30 主分类号 H01L21/302
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