发明名称 LASER CONTINUOUS ANALYSIS OF METAL AND INSULATOR IN FLUIDIZED STATE
摘要 PURPOSE:To improve the analytical precision by setting the distance between a condenser lens and a molten material and the focal distance of the condenser lens to a prescribed relation in spectroscopic analysis of an emission spectrum obtained by irradiating laser light to the molten material to be measured in fluidized state. CONSTITUTION:The laser light emitted from a laser oscillator 1 is bent downward by a prism 2, and condensed at the surface of the molten material 4 to be measured in fluidized state by the condenser lens 3. The emission spectrum generated by the irradiation is introduced to a spectrometer 10 by a light introducing system consisting of a concave mirror 8, plane mirrors 9a, 9b. To prevent an intensity variation of the emission spectrum due to up-and-down movement of the material 4, the distance l between the lens 3 and the surface of the material 4 is regulated to 0.95f<=l<=1.05f with respect to the focal distance (f) of the lens 3. The stable analyzed value can be obtained independently of the up-and-down movement of said molten material.
申请公布号 JPS60347(A) 申请公布日期 1985.01.05
申请号 JP19830108456 申请日期 1983.06.16
申请人 KAWASAKI SEITETSU KK;NIHON BUNKOU KOGYO KK;BUNKOU KEIKI KK 发明人 SUMIYAMA KOUZOU;TANIMOTO WATARU;OOHASHI ZENJI;KIMURA SHIGEYUKI;ASAKAWA FUMIO
分类号 G01N21/63;G01N21/71;(IPC1-7):G01N21/71 主分类号 G01N21/63
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