发明名称 |
LASER CONTINUOUS ANALYSIS OF METAL AND INSULATOR IN FLUIDIZED STATE |
摘要 |
PURPOSE:To improve the analytical precision by setting the distance between a condenser lens and a molten material and the focal distance of the condenser lens to a prescribed relation in spectroscopic analysis of an emission spectrum obtained by irradiating laser light to the molten material to be measured in fluidized state. CONSTITUTION:The laser light emitted from a laser oscillator 1 is bent downward by a prism 2, and condensed at the surface of the molten material 4 to be measured in fluidized state by the condenser lens 3. The emission spectrum generated by the irradiation is introduced to a spectrometer 10 by a light introducing system consisting of a concave mirror 8, plane mirrors 9a, 9b. To prevent an intensity variation of the emission spectrum due to up-and-down movement of the material 4, the distance l between the lens 3 and the surface of the material 4 is regulated to 0.95f<=l<=1.05f with respect to the focal distance (f) of the lens 3. The stable analyzed value can be obtained independently of the up-and-down movement of said molten material. |
申请公布号 |
JPS60347(A) |
申请公布日期 |
1985.01.05 |
申请号 |
JP19830108456 |
申请日期 |
1983.06.16 |
申请人 |
KAWASAKI SEITETSU KK;NIHON BUNKOU KOGYO KK;BUNKOU KEIKI KK |
发明人 |
SUMIYAMA KOUZOU;TANIMOTO WATARU;OOHASHI ZENJI;KIMURA SHIGEYUKI;ASAKAWA FUMIO |
分类号 |
G01N21/63;G01N21/71;(IPC1-7):G01N21/71 |
主分类号 |
G01N21/63 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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