| 发明名称 |
High throughput circuit tester and test technique avoiding overdriving damage. |
| 摘要 |
<p>A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital in-circuit test techniques.</p> |
| 申请公布号 |
EP0128774(A2) |
申请公布日期 |
1984.12.19 |
| 申请号 |
EP19840303974 |
申请日期 |
1984.06.13 |
| 申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
GROVES, WILLIAM A.;HARWOOD, VANCE RUSSEL;FAY, THOMAS R.;BINGHAM, ELTON CURTIS;TESKA, MICHAEL ANTHONY |
| 分类号 |
G01R31/26;G01R31/28;G01R31/319;(IPC1-7):01R31/28 |
主分类号 |
G01R31/26 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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