发明名称 SPUTTERING SYSTEM TO PROCESS A BATCH OF WAFERS
摘要 A sputtering system adapted for depositing quartz in uniform thicknesses upon multiple wafers processed in batches including an anode plate having a plurality of wafer locations spaced from the center of the anode, with each wafer location comprising a wafer receiving recess in the anode plate having an angular bottom slope which, in effect, tilts the wafer to an optimum deposition angle with respect to the cathode, depending upon wafer spacing from the center of the anode, to insure uniform deposition across the wafer.
申请公布号 DE3069592(D1) 申请公布日期 1984.12.13
申请号 DE19803069592 申请日期 1980.07.01
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 GALICKI, ARKADI;HAYUNGA, CARL PETER;SARKARY, HOMI GUSTADJI
分类号 C23C14/22;C23C14/34;(IPC1-7):C23C15/00 主分类号 C23C14/22
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