发明名称 SUBSTRATE INSPECTING DEVICE
摘要 PURPOSE:To attain detection with components having small differences in brightness from the surface color of a substrate by integrating the brightness level difference between a reference substrate and a substrate to be measured within a component area range and comparing the integrated value. CONSTITUTION:A mask pattern stored previously in a memory circuit 10 is read out synchronizing with scans of photographing devices 1 and 2 through a synchronizing signal generating circuit 6 to control integrators 8 and 9. When the mask pattern outputted from the mask pattern memory circuit 10 is 1, video signals from the photographing devices 1 and 2 are integrated, and when 0, the value is held. An adder 3 calculate the level difference between the integrated values, and a decision circuit 4 decides on whether the difference is larger than a specific value or not and sends the result to a latch circuit 7. This decision data is latched at the rising of a frame synchronizing singal and sent out to a controller 5.
申请公布号 JPS59216005(A) 申请公布日期 1984.12.06
申请号 JP19830090690 申请日期 1983.05.25
申请人 HITACHI DENSHI KK 发明人 WATANUKI AKIO
分类号 G01B11/24;G01B11/245;G01B11/30;G03F7/20;(IPC1-7):G01B11/24 主分类号 G01B11/24
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