发明名称 High-temperature Hg anneal for HgCdTe
摘要 The dislocation density near the surface of Hg1-xCdxTe alloys is substantially reduced by annealing the material at around 600 DEG C. in a mercury saturated ambient for periods of four hours or more, prior to post annealing at lower temperatures to control the metal vacancy concentration. This procedure allows dislocation reduction by climb, reduces the concentration of metal vacancies which can collapse to form dislocation loops or contribute to dislocation multiplication, and reduces tellurium precipitates which contribute to dislocation multiplication during subsequent post annealing.
申请公布号 US4481044(A) 申请公布日期 1984.11.06
申请号 US19840591903 申请日期 1984.03.21
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SCHAAKE, HERBERT F.;TREGILGAS, JOHN H.
分类号 C22C1/00;H01L21/477;(IPC1-7):C21D1/74 主分类号 C22C1/00
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