发明名称 INSPECTING METHOD OF ELECTRONIC COMPONENT
摘要 PURPOSE:To execute a connection necessary for inspection speedily, securely, and stably by providing an elastic contactor whose legs are opened freely by a pressing force, and connecting the lead of the electronic component to the terminal of an inspecting circuit through a freely movable conduction member. CONSTITUTION:The lead 28 of the electronic component 25 such as an IC positioned at a holding member 22 is connected to the terminal 31 of the inspecting circuit 33 which projects from a base plate 21 by the contactor 36 of the conduction member 35. This movable member 35 is moved toward the lead 28 through a backward movement driving source 58, and then the elastic contactor 36 contacting the lead 28 and terminal 31 have the legs open to connect the lead 2 and terminal 31 to each other stably. Therefore, the connection necessary for the inspection is made speedily, securely, and stably and the electronic component is inspected excellently by a stable inspection current.
申请公布号 JPS59192979(A) 申请公布日期 1984.11.01
申请号 JP19830066597 申请日期 1983.04.15
申请人 MITSUTOYO SEISAKUSHO:KK 发明人 WATANABE TERUO
分类号 G01R31/18;G01R31/26;H01R33/76 主分类号 G01R31/18
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