发明名称 FLAW DETECTING AND THICKNESS MEASURING METHOD
摘要 PURPOSE:To enhance ultrasonic flaw detecting and thickness measuring sensitivity, by interposing a conductive medium between an electromagnetic ultrasonic probe and a material to be inspected. CONSTITUTION:When a conductive medium 11 such as an alumina powder is interposed between an electromagnetic ultrasonic probe and a material 1 to be inspected 1, equivalent impedance to the eddy current generated in the surface part of the material to be inspected becomes small by the internal flaw of the material 1 to be inspected or the ultrasonic wave reflected from the other surface thereof and the eddy current receiving sensitivity by the probe 7 is enhanced. As a result, electromagnetic ultrasonic flaw detection and thickness measuring sensitivity is enhanced.
申请公布号 JPS59183366(A) 申请公布日期 1984.10.18
申请号 JP19830058964 申请日期 1983.04.04
申请人 HITACHI SEISAKUSHO KK 发明人 ITOU SUSUMU;SATOU KAZUYA;KADOWAKI TAKASHI;FUJIMOTO MINORU;TSUCHIYA KENJI
分类号 G01N27/90;G01B17/02;G01N29/04;G01N29/24 主分类号 G01N27/90
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