| 摘要 |
<p>A method and apparatus for real-time high-speed inspection of objects (Figures 1-2, 7a and 10a) involving storing digital signal mask information (Recognition Memory) of optical scans of objects at different magnifications (Figures 3-5, 8 and 9), but with substantially the same field of view, and comparing digital mask information obtained by run scans of objects-to-be-inspected, at different magnifications, with the stored mask information to identify known or unknown portions of the objects, with adaptability for rapid "teaching" of large sets of objects for storage and subsequent comparison with real objects under inspection. </p> |
