| 摘要 |
A workpiece 18 classifying and marking system 10 is disclosed. The system includes a probe 12 for generating signals in response to the detection of defects along the workpiece length as that workpiece rotates and traverses past the probe 12. Circuitry coupled to the test head analyzes defects according to severity and classifies the workpiece as either "good", "salvageable", or "scrap". The circuitry also causes a marker 14 to affix a flaw indicating mark to the workpiece at the flaw location. The circuitry includes a flaw detection circuit 60, a defect classifying circuit 72, a timing control circuit 70, and a marker delay circuit 74. The timing control 70 transmits timing signals of different frequency to the defect classifying 72 and marker control 74 circuits and coordinates their operation. The defect classify circuit 72 divides the workpiece into quadrants and can sense the length of any flaws in each quadrant as the workpiece passes the probe 12. The detection of a flaw causes the timing control circuit to resynchronize itself by centering the flaw within a workpiece quadrant thereby preventing the flaw from "wandering" out of the quadrant. The circuitry is controllable by the user to change workpiece classification as a function of the use to which the workpiece is to be put.
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