发明名称 HIGH FREQUENCY UNBALANCE INSPECTING METHOD OF TRANSISTOR
摘要 PURPOSE:To execute easily a discrimination which is suitable for a practical use by detecting a discontinuity to frequency. CONSTITUTION:A signal which is subjected to a frequency sweep at a constant speed through a sweep oscillator 1 of a constant level output by a feedback control, an isolator 7, etc. is impressed to a transistor 8 to be inspected. Subsequently, an output amplified by the transistor 8 is detected by a detector 12, and thereafter, processed by a differentiating circuit 13. As a result, in case when the transistor 8 is ill-balanced, a discontinuity is generated in a frequency characteristic, a pulse corresponding to a sudden variation following said scontinuity is generated from the circuit 13, and a generated pulse is counted by a counter 14, by which it is possible to execute easily a decision which is suitable for a practical use as to whether a high frequency balance of the transistor is good or not.
申请公布号 JPS59145974(A) 申请公布日期 1984.08.21
申请号 JP19830019214 申请日期 1983.02.08
申请人 NIPPON DENKI KK 发明人 TAKEUCHI TOSHIHARU
分类号 G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址
您可能感兴趣的专利