发明名称
摘要 PURPOSE:To enable to detect erroneous patterns accurately and in a short time without depending on a human visual test by a method wherein, while checking the reference pattern with the part corresponding to each pattern to be tested, the automatic test is performed. CONSTITUTION:The mask pattern information is extracted from an information processing device 1 and transmitted into a figure display device 2. The dark- bright information at each part on the display surface of the device 2 is transmitted into a photoelectric conversion device 4, thus converted into an electric signal, which signal is shaped into a binary wave form in a wave form shaping circuit 5 and supplied into a summing device 9. On the other hand, each part of a mask 12 is converted into an electric signal in a photoelectric conversion device 7 then shaped into a binary wave form in a wave form shaping circuit 8 and supplied into the device 9, which device takes the exclusive logical sum of output pulses of the circuits 5 and 8. Therefore, when the both input pulses are coincident with each other, the output is 0, and the output is 1 only when different to each other. The output of the device 9 is converted into a light using a photoelectric conversion device 10 and recorded into a photo device 11.
申请公布号 JPS5932891(B2) 申请公布日期 1984.08.11
申请号 JP19830013378 申请日期 1983.01.28
申请人 NIPPON ELECTRIC CO 发明人 TAKECHI SHIZUHITO;SUGYAMA HISASHI
分类号 G01N21/88;G01N21/93;G01N21/956;G03F1/84;G06T7/00;H01L21/027;H01L21/30;H01L21/66 主分类号 G01N21/88
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