发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE WITH MULTILAYER WIRING STRUCTURE
摘要 PURPOSE:To prevent the stepwise disconnection of wirings at a stepped part in a semiconductor device and to improve the controllability of the thickness of a conductor film by increasing the thickness of the film, burying a resist in the recess of the film and removing by etching the resist. CONSTITUTION:A conductor film 1 is formed in a sufficient thickness on an interlayer insulating film 2. The recess of the film is buried by coating a resist to smoothen the surface. The resist and the film and partly removed by the same etching rate of plasma or sputter etching. In this manner, the equalized film 6 is obtained, thereby preventing the stepwise disconnection of the wirings at the stepped part.
申请公布号 JPS59104142(A) 申请公布日期 1984.06.15
申请号 JP19820214251 申请日期 1982.12.07
申请人 NIPPON DENKI KK 发明人 ITOU TAKAHIRO
分类号 H01L21/3213;G03F7/26;H01L21/302;H01L21/3065 主分类号 H01L21/3213
代理机构 代理人
主权项
地址