| 摘要 |
A signal sampling and conversion system for high-frequency sampling of either recurrent or non-recurrent signals in which the electron beam (6) generated by an electron gun assembly (2) of a CRT (1) is scanned across a charge coupled device (5) consisting of an array of storage elements located at the focal plane of the electron beam (6), with the time base and defection cicuit (9) of the CRT (1) being used to scan the beam (6) across the array at a rate equal to the sample rate. Depending on the configuration of the storage elements, which can be a linear array of rectangular or triangular elements, or a rectangular array, the beam current (6) is modulated or the Y deflection plates (3) are controlled by the input signal (13). Charges accumulate in the elements of the array which are indicative of the amplitude or range of amplitudes of the input signal (13) during the period of each sample; the accumulated charges are transferred from the storage elements, quantized (10) and digitally processed (11) to yield the amplitude of the signal. |
