发明名称 IC TEST JIG
摘要 PURPOSE:To enable the observation of the acceptance output of an IC to be measured simultaneously with outputs thereof by operating an IC to be measured simultaneously with an IC of the same type as the IC being measured mounted on a jig on the same input condition. CONSTITUTION:When there is fear of any trouble in an IC10 packaged on a printed circuit board 1,000, a jig 310 is fixed pinching the IC10. Then, an accepted IC20 of the same type as the IC10 being measured is mounted on a socket section 900 of the jig 310 in the same direction of the IC10 being measured. At this point, 1-circuit/2-contact switches 711, 712, 717 and 721 are closed while a 1-circuit/2-contact switch 713 is left open. The same input signal with the IC10 is applied to an input terminal of the IC20. As a result, an output waveform of the IC10 being measured is outputted from an output terminal 613 while a correct output waveform of the accepted IC20 from an output terminal 623. Therefore, these output waveforms are observed simultaneously with an oscilloscope to facilitate the decision on the quality of the IC10 being measured.
申请公布号 JPS5985970(A) 申请公布日期 1984.05.18
申请号 JP19820196242 申请日期 1982.11.09
申请人 NIPPON DENKI KK 发明人 TAKANO SEIJI
分类号 G01R31/28;H01L21/66;H01L23/32 主分类号 G01R31/28
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