| 摘要 |
PURPOSE:To achieve a simultaneous testing of DC items about all pins by implementing the testing of DC items selecting a load resistance group provided on a performance board. CONSTITUTION:Relays R1-R6 and the like are controlled through a relay control circuit 9 in response to a tester 3 to select load resistances VOL1, VOL2, VOH1 and VOH2 on a performance board and set a resistance value as determined by output limit voltage/applied current in the measurement of output voltage and applied voltage/limit current in the measurement of input current. This enables the simultaneous testing of DC items about all pins in a device IC1 to be measured in the similar manner as with functional items. |
