发明名称 SPUTTERING METHOD
摘要 PURPOSE:To obtain a metal pattern free from white turbidity or the like adhered to a wafer, by sputtering the wafer in such a state that the surface of said wafer is masked by a desired pattern formed of a heat insulating material to prevent the rising in the temp. of the wafer. CONSTITUTION:A wafer 6 is masked in such a state that a desired pattern 8 formed of a heat insulating material is applied to the surface thereof and used in an anode side while an Al target 5 is used in a cathode side to perform sputtering. In this case, Al paticles projected toward the wafer 6 from the Al target 5 reach the surface of the wafer 6 only from the pattern part 8 and the parts other than said pattern part 8 are blocked by the heat insulating material 7. By this method, the amount of Al particles impinged to the wafer 6 is limited to prevent the rising in the temp. of the wafer 6 and the white turbidity of adhered Al is prevented and, at the same time, a pattern can be formed.
申请公布号 JPS5941474(A) 申请公布日期 1984.03.07
申请号 JP19820152254 申请日期 1982.08.31
申请人 MATSUSHITA DENKO KK 发明人 KATAOKA MANJI
分类号 C23C14/04;H01L21/285 主分类号 C23C14/04
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