发明名称 REFLECTANCE MEASURING INSTRUMENT
摘要 PURPOSE:To allow even reflected light from a lustrous sample to reache a photodetection surface, by arranging a refraction optical system for illuminating the sample between a light source and the sample at such an angle that the reflected light from the sample is made incident to the photodetection surface. CONSTITUTION:A Fresnel lens 5 has a flat surface as its front surface 5a and concentrical grooves in its rear surface 5b so that the section is in a sawtooth shape. Incident light 9 to the Fresnel lens 5 is refracted by the lens 5 and radiated as shown by projection light 10. Light 4a radiated from a light source 4 illuminates the sample 7 through the Fresnel lens 5 and reflected; all specularly- reflected components of the reflected light are made incident to the photodetecting element 6 because the light 4a from the light source 4 illuminates the sample 7 at the angle through the Fresnel lens 5. Therefore, not only diffused components, but also the specularly reflected components are measured, so the reflectance is measured regardless of the characteristics of the sample.
申请公布号 JPS5937448(A) 申请公布日期 1984.02.29
申请号 JP19820148021 申请日期 1982.08.25
申请人 MATSUSHITA DENKI SANGYO KK 发明人 SUMI SEIJI;TAMARU SHIYUUJI;TANABE YOSHINORI
分类号 G01N21/47 主分类号 G01N21/47
代理机构 代理人
主权项
地址
您可能感兴趣的专利