首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
DEVICE FOR MEASURING SPECTRAL CHARACTERISTICS OF ACOUSTIC EMISSION SIGNALS
摘要
申请公布号
SU1075145(A1)
申请公布日期
1984.02.23
申请号
SU19823452428
申请日期
1982.06.14
申请人
LYKOV YURIJ,SU;GORBUNOV ANDREJ,SU;OVCHARUK VALERIJ N,SU
发明人
LYKOV YURIJ I,SU;GORBUNOV ANDREJ I,SU;OVCHARUK VALERIJ N,SU
分类号
G01N29/14;G01N29/04;G01N29/40;G01N29/46;(IPC1-7):G01N29/04
主分类号
G01N29/14
代理机构
代理人
主权项
地址
您可能感兴趣的专利
CUSTOMER PREMISE NETWORK SYSTEM, SUBSCRIBER TERMINATING DEVICE USED FOR THE SYSTEM, AND MODEM DEVICE INCORPORATED WITH TERMINAL ADAPTER FOR THE SYSTEM
SOUND OUTPUT APPARATUS AND METHOD, PROGRAM, AND RECORDING MEDIUM
AUDIO DATA PROCESSING CIRCUIT, AND ELECTRONIC APPARATUS MOUNTING IT
IMAGE PROCESSING METHOD AND IMAGE PROCESSOR
FILM MODE DETECTOR AND VIDEO DISPLAY
SYSTEM AND METHOD FOR PREVENTING LOST CHILD, MASTER AND SLAVE USED FOR THE SYSTEM, AND PROGRAM
DEVICE AND METHOD FOR RECORDING INFORMATION, PROGRAM, AND RECORDING MEDIUM
COMMUNICATION TERMINAL DEVICE
LAMINATED FILTER
MOBILE PHONE AND EXTERNAL DEVICE
IMAGING APPARATUS
NOISE FILTER AND NOISE FILTER CIRCUIT
PHOTOLITHOGRAPHIC METHOD IN PRODUCTION OF SEMICONDUCTOR DEVICE
ELECTRONIC DEVICE, METHOD FOR MANUFACTURING SAME, AND WIRING BOARD
FLUORINE RESIN PRINTED CIRCUIT BOARD AND MANUFACTURING METHOD THEREOF
SEMICONDUCTOR DEVICE AND EVALUATION METHOD THEREOF
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
MINUTE SAMPLE PROCESSING OBSERVATION METHOD AND DEVICE
ELECTRON BEAM DETECTOR AND ELECTRON BEAM CURRENT MEASURING METHOD
DISPLAY DEVICE AND ITS MANUFACTURING METHOD