发明名称 SEMICONDUCTOR DEVICE OF HIGH WITHSTAND VOLTAGE
摘要 PURPOSE:To form a device in a structure suitable for high withstand voltage formation by a method wherein low impurity concentration regions are provided in the periphery of an impurity region which composes a transistor, resistor, etc., and wirings are provided on the low impurity concentration region. CONSTITUTION:The base region of a N-P-N transistor, or the emitter and collector regions of a P-N-P transistor, and a resistor are composed by providing a P type diffused layer on the main surface of an N type semiconductor substrate 1. The regions 3 of low impurity concentration are formed in the periphery of this region 2. Then, the metallic wirings 5 are provided on the surface of the substrate 1 via an insulation film 4, without being positioned on the region 2, on the regions 3.
申请公布号 JPS5931061(A) 申请公布日期 1984.02.18
申请号 JP19830123256 申请日期 1983.07.08
申请人 HITACHI SEISAKUSHO KK 发明人 IMAIZUMI ICHIROU;KIMURA MASATOSHI;OCHI SHIKAYUKI;YOSHIMURA MASAYOSHI;YAMAGUCHI TAKASHI;KOUDA TOYOMASA
分类号 H01L27/04;H01L21/331;H01L21/822;H01L29/72;H01L29/73 主分类号 H01L27/04
代理机构 代理人
主权项
地址