| 摘要 |
PURPOSE:To test the operation durability of all temperature switches easily in a short time and to test the limit number of times of operation by moving a switch support member where a temperature switch can be fitted to a high and a low temperature chamber alternately by a driving device under the control of a controller. CONSTITUTION:The housing 1 of the thermostatic chamber 100 of a testing device is divided by two into the high temperature chamber H and low temperature chamber L by a rotating shaft 2 and the temperature switch support member 7 where plural temperature switches Sn are fitted is arranged on the rotating shaft 2. A speed reducer 5 which is driven by a motor 6 is arranged at one end of the rotating shaft 2 and the switches Sn fitted to th support member 7 are arranged in the high temperature chamber H and low temperature chamber L alternately through the rotation of the rotating shaft 2. The positions of the switches Sn are detected by a lever 4A and position detection switches S10 and S20 arranged at the other end of the rotating shaft 2. Then, a controller 10 controls the motor 6 in response to the detected positions of the switches S10 and S20 to test the durability of all the switches Sn securely in a short time.
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