发明名称 |
Method and device for testing optical imaging systems |
摘要 |
Optical imaging systems are used for making microstructures, and have to be very precise. In order to test these imaging systems, a new method, and a device for carrying out this method, are described in which two interferograms are made and compared. In a first step, an interferogram of an original pattern is made, followed by a second step in which an interferogram of a copy of the original pattern is produced using the identical conditions used to form the first interferogram. The pattern copy is made in the imaging system to be tested. In a third step, the two interferograms are compared with one another to provide a measure of the accuracy of the imaging system. This technique can be used for testing imaging systems which produce only a mirror image.
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申请公布号 |
US4429992(A) |
申请公布日期 |
1984.02.07 |
申请号 |
US19810266243 |
申请日期 |
1981.05.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
HAEUSLER, GERD;JAERISCH, WALTER;MAKOSCH, GUENTER |
分类号 |
G01B9/02;G01M11/00;(IPC1-7):G01M11/00;G01B11/14;H01L21/66 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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