发明名称 PUNCHING COLLECTION METHOD FOR THIN PLATE TEST PIECE AND ITS EQUIPMENT
摘要 PURPOSE:To automatically perform the punching of the necessary thin plate test piece by storing the kind, number of plates, identifying mark, etc. of a thin plate test piece into a numerical control unit and by punching a sample material in order by a turret punch. CONSTITUTION:A sample material 9 is stacked in order on a stock base 10 and the maximum number of pieces, punching order, identifying mark, etc. on each sample material 9 are stored in a numerical controller 16. The loaded sample material 9 is taken out in order by the vacuum suction pad 13 of a transfer means 12 contrary to the loading order. This sample material 9 is moved onto a work table 2 by confirming with a double plate detector 14 and held by arranging the coordinate original point of the numerical control. A work lamp 3 moves the sample material 9 by the control signal of the NC 16 applied on a longitudinal slide 4 and horizontal slide 4' and the hammering is performed by the hammer set inside a pressurizing head 8 under the selective control of the punch. In this way the necessary test piece is collected from each sample material 9 by repeating in order the marking of the identifying mark and the punching press succeeding thereto.
申请公布号 JPS62166031(A) 申请公布日期 1987.07.22
申请号 JP19860004146 申请日期 1986.01.14
申请人 KAWASAKI STEEL CORP;OFIC CO;AMADA CO LTD 发明人 SATO AKIMUNE;MAEGAKI KENICHI;MIYAMOTO HIROSHI;HIRATA TAKESHI;KOBAYASHI HIDEO
分类号 B21D28/02;B21D28/36;B21D43/00;G01N1/04 主分类号 B21D28/02
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