| 摘要 |
An apparatus for removing solder bonded devices from a substrate which includes a hollow housing element having an open end with a seating portion adapted to engage the flat backside of a semiconductor device, an inlet for admitting heated gases to the interior of the housing, and an outlet for the heated gases, a baffle within the housing having an end portion recessed from the seating portion of the housing wherein the baffle directs heated gas downwardly against the backside of the device when in engagement with the seating portion of the housing, and a clamping means to secure a semiconductor device in seated relation on the seating portion. A rework method for removing a solder bonded semiconductor device from a ceramic substrate leaving only a coating of solder on the pad site sufficient to solder bond another device without the need for additional pad site preparation which includes the steps of preheating the substrate and solder bonded devices to a temperature not greater than 100 DEG C. less than the melting point of the solder of the solder bonds, selectively directing a constrained stream of heated inert gas to the backside of the device to quickly raise the temperature of the solder bonds above the melting point of the solder, and lifting the device from the substrate before the heat applied by the heated gas significantly heats the top of the substrate above the pre-heated temperature. |
