发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PURPOSE:To break a dummy wiring section easy to be broken prior to true wiring prior to a true wiring section even when a primary factor of breaking such as a surge is generated, to prevent the breaking of the true wiring section and to improve reliability by setting up dummy wiring apart from true wiring. CONSTITUTION:Dummy Al wirings 13, 14 are each connected to Al wirings 11, 12. A distance d2 between the Al wirings 13, 14 is made shorter than one d1 between the Al wirings 11, 12. That is, an electric field stronger than that between the Al wirings 11, 12 is generated between the Al wirings 13, 14, and the Al wirings 13, 14 are each to be broken at speed faster than the Al wirings 11, 12. Accordingly, since electrolytic etching which has been generated between the Al wirings 11, 12 in conventional circuits transfers between the Al wirings 13, 14, the Al wiring 13 or the Al wiring 14 is disconnected prior to the Al wirings 11, 12, and the breaking of the Al wirings 11, 12 can be prevented.
申请公布号 JPS592357(A) 申请公布日期 1984.01.07
申请号 JP19820111219 申请日期 1982.06.28
申请人 TOKYO SHIBAURA DENKI KK 发明人 IWATA TAKAO
分类号 H01L21/822;H01L21/3205;H01L23/52;H01L23/62;H01L27/04 主分类号 H01L21/822
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