| 摘要 |
PURPOSE:To perform a stable test rapidly, by performing a test in such a state that a high speed photodetector and a high speed light emitting element are preliminarily inserted in the input and output terminals of each electronic circuit block. CONSTITUTION:When an electronic circuit package 1 is tested, a test is started from a left upward electronic circuit block 3 at first. In this case, in such a state that testing mode setting optical signal is preliminarily inputted to the testing mode setting photodetector 6 of the block 3, and a testing electric input signal and a testing optical input signal are respectively preliminarily inputted to an external terminal 2 and a high speed photodetector 5, the optical output signal from a high speed light emitting element 4 is looked to finish the testing of the left upward block 3. Next, the block 3 is successively replaced to perform a test in the same way and, when the testing of all of the block is finished, the testing of the package 1 is finished. By this method, not only a vacuum means for directly erecting a metal probe on the terminal of IC in the package 1 but also a jig for erecting many kinds of metal probes become unnecessary.
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