发明名称 Bipolar transistor structure for very high speed circuits and method for the manufacture thereof
摘要 A bipolar transistor structure wherein the emitter zone is produced by outward diffusion from etching residues which are formed by deposition of conductive material and re-etching, with the etching residues forming part of the emitter terminal region. In addition to individual transistors, pairs of transistors having coupled emitters can also be produced and employed in hig precision differential amplifiers. Memory cells can also be produced which have low surface requirements, particularly due to the reproduceable attainment of emitter widths below one micron. Since the methods enable the production of completely self-aligned transistors, they can be implemented with straightforward steps which are largely independent of lithography. Emitter widths in the range of about 0.2 to 0.5 microns can be produced.
申请公布号 US4889823(A) 申请公布日期 1989.12.26
申请号 US19890358672 申请日期 1989.05.30
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 BERTAGNOLLI, EMMERICH;WEGER, PETER
分类号 H01L29/73;H01L21/225;H01L21/285;H01L21/331;H01L21/8222;H01L21/8229;H01L27/06;H01L27/082;H01L27/102;H01L29/08;H01L29/417;H01L29/732 主分类号 H01L29/73
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