发明名称 APPARATUS FOR CONTINUOUSLY MEASURING POLISHED DEGREE OF GRAIN
摘要 PURPOSE:To measure the polished degree of flowing grain continuously by flowing the grain at the optimum state for measuring by changing the angle of a sample path, and measuring the reflected light and transmitted light from the sample. CONSTITUTION:A wall 13' of a sample flow path 13 on the side of a light source device is inclined to an angle, so that the longitudinal direction of each grain is aligned with the advancing direction and the grain flows in this state. A wall 13'' of the sample flow path 13 on the opposite side of the light source device is constituted at an angle, so that the grain is compressed to the wall and flows without a gap between the wall and the grain. Meanwhile, light from the light source device, which comprises a light source lamp 7, a heat wave absorbing filter 8, a monochromatic filter 9, and a condenser lens 10, is irradiated on the sample path 13 through an integrating sphere 12. A transmitted light receiving element 14' and a reflected light receiving element 14 receive the transmitted light and reflected light from the sample, respectively. By the reflected quantity from an amplifier 5 and the transmitted quantity from an amplifier 5', an expression (polished degree-reflected quantity+K.transmitted quantity) is computed by an operating element 4, and the result is displayed by an indicator 1.
申请公布号 JPS58211630(A) 申请公布日期 1983.12.09
申请号 JP19820094063 申请日期 1982.06.03
申请人 SATAKE SEISAKUSHO:KK 发明人 SATAKE TOSHIHIKO;HOSAKA YUKIO
分类号 G01N21/49;B02B7/00;G01N21/17;G01N21/47;G01N21/53;G01N21/59;G01N21/85;G01N33/10 主分类号 G01N21/49
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