发明名称 METHOD FOR MEASURING RESIDUAL STRESS
摘要 PURPOSE:To enable highly accurate measurement without imparting damage to a structure, by measuring the change in the surface strain of the structure to calculate the inherent strain corresponding to the strain being measured and applying said inherent stress to the original structure to calculate the residual stress in said matter. CONSTITUTION:An external memory device 2, an external data input device 3, a printing display device 4 and a graph figure forming device 5 are connected to a central operational processing unit 1. A plurality of structure strain gauges 10 are preliminarily adhered to the cutting and removing area of the structure being the measuring object of residual stress to detect the change in the strain of the member accompanied by the cutting-off of said area and the outputs of said gauges 10 are inputted to a strain measuring device 8. The central operational processing unit 1 calculates the inherent strain of the structure corresponding to the relation between the measured strain value and elastic response. The quantity of this inherent strain is applied to the whole of the original structural member to calculate the whole stress distribution in the member.
申请公布号 JPS62194429(A) 申请公布日期 1987.08.26
申请号 JP19860035188 申请日期 1986.02.21
申请人 HITACHI LTD 发明人 KOJIMA HIROYUKI;SHIMIZU TASUKU;ENOMOTO KUNIO
分类号 G01L1/00 主分类号 G01L1/00
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