| 摘要 |
PCT No. PCT/EP95/00447 Sec. 371 Date Feb. 22, 1996 Sec. 102(e) Date Feb. 22, 1996 PCT Filed Feb. 8, 1995 PCT Pub. No. WO95/25951 PCT Pub. Date Sep. 28, 1995The invention relates to a device for emission spectrum analysis with an analysis plasma containing the analysis sample and a spectrometer suitable for emission measurements, in which there is a plasma manipulator (4) with a cooled diaphragm (8) concentric with the axis (7) and perpendicular to the direction of expansion of the plasma with a free diameter smaller than that of the plasma which allows only the central part (6) or only the optical part of the analysis plasma to pass and masks off the remaining region, and an observation device (3) for the radiation emission of the volume of plasma allowed through. |
