| 摘要 |
PURPOSE:To measure transmittance simply and exactly by reflecting the luminous flux transmitted through 1/4 wave length plate of a polarized light prism to be measured having a polarization film and 1/4 wavelength plate by a back mirror having an incidence material corresponding to the using condition of the prism. CONSTITUTION:The laser luminous flux prepared to S polarized light etc. by a light source unit 2, a polarization film unit 3 etc. is divided into two parts by a beam splitter 4 and one part is received in a light receiver 7. The other is reflected by a polarization film 32 of a work 30 of the prism to be measured, passed through a reflection surface 33 and 1/4 wave length plate 34, reflected to the incidence side by the back mirror 53 having an acrylic plate 54 of different material and thickness etc. according to the actual using state of the work 30 and is passed again through the plate 34 and prepred to P polarized luminous flux. This flux is reflected by the surface 33, transmitted through the film 32 and received in the receiver 7' and the transmission factor of the work 30 is calculated and measured. By this constitution, the performance inspection due to the transmission factor measurement of the polarized prism agreed with the paractical usage can be performed simply and exactly. |
