发明名称 METHOD FOR MEASURING THREE-DIMENSIONAL FREE CURVED SURFACE AND PROBE DEVICE
摘要 PURPOSE:To obtain a device which measures three-dimensional free curved surfaces, by using a probe of optional shapes. CONSTITUTION:A contact ball 2 which is in contact with an origin ball 1 is directly coupled to a spherical probe 4 with a shaft 3 for transmitting displacement. The shaft 3 is supported by means of a three-dimensional parallel moving mechanism. To measure the coordinates of the 3rd axis where the 1st axis and the 2nd axis are fixed, the ball 1 is driven from the direction of the 3rd axis and the probe 4 is brought close to a measuring surface 5; further, when the ball 2 is driven clockwise while held in contact with the ball 1, the probe 4 contacts the points P1, P2 of the surface 5. Thereupon, the ball 2 is stopped at the intermediate points of the two displacing coordinates within the planes of the 1st axis and 2nd axis viewed from the direction of the 3rd axis of the ball 2 when the probe 4 contacts the points P1, P2. Again, the ball 1 is driven finely from the direction of the 3rd axis and when the ball is successively centered from the intermediate point to the intermediate point by repeating the above-described operations, the limits of the points P1, P2 converge successively at one point, and the centering of the contact point of the probe 4 to the true measuring point is completed. Even if a probe 7 of an optional shape is used, the similar effect is obtd. by using a moving function cam 8 which corrects and eliminates the influence of said optional shape.
申请公布号 JPS58160808(A) 申请公布日期 1983.09.24
申请号 JP19820041637 申请日期 1982.03.18
申请人 SHINOHARA YOSHITO 发明人 SHINOHARA YOSHITO
分类号 G01B7/28;G01B5/20;G01B7/016;G01B21/00;G01B21/20 主分类号 G01B7/28
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