发明名称 MANUFACTURE OF RADIOSENSITIVE RESIST MATERIAL
摘要 PURPOSE:To obtain a radiosensitive resist material suitable for forming minute patterns of a semiconductor, optical parts, magnetic bubble elements, etc., by reacting naphthol with a prescribed poly-lower-alkyl methacrylate, and chloromethylating it. CONSTITUTION:A living polymer of a lower acryl methacrylate is reacted with naphthol, and then, the product is reacted with a chloroethyl lower alkyl ether to produce a radioactive resist material contg. a polymer represented by the formula in which (l) is a positive integer, (m) is 0 or a positive integer, and (p) is 1-7. This material can form a minute pattern of a polymer film high in radiosensitivity, resolution, and dry etching resistance, and usable for manufacture of elements of a semiconductor and magnetic bubbles, and optical article parts.
申请公布号 JPS58143337(A) 申请公布日期 1983.08.25
申请号 JP19820024620 申请日期 1982.02.19
申请人 NIPPON DENSHIN DENWA KOSHA 发明人 IMAMURA SABUROU;TAMAMURA TOSHIAKI;SUGAWARA SHIYUNGO
分类号 G03F7/26;C08F8/00;C08F8/20;C08F8/24;C08L33/00;C08L33/02;C08L33/04;G03F7/004;G03F7/038;G03F7/039;H01L21/027 主分类号 G03F7/26
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