发明名称 DETECTING CIRCUIT
摘要 PURPOSE:To set a practical operation level easily, by varying a reference level for a comparison regarding the level of an input signal to a detecting circuit which detects the operation temperature of a specific element in a semiconductor integrated circuit according to an output. CONSTITUTION:A temperature sensor part 200 has the different lead-out point of an output to a comparing circuit 300 from a conventional point and the connection point between resistances 2 and 3 is connected to the base of a transistor (TR) 5. The comparing circuit 300 is provided with two series-connected diodes 21 and 22 connected to the resistance 2 in parallel. For example, a constant current 4 is 200 muA and a constant current 6 is 40 muA; the hFE of a TRI is 10 and that hFE of the TR5 is 50; and resistances 2 and 3 are so set that 0<R2 and R3<10KOMEGA. Then, an error due to a base current component is <2mV (i.e. + or -1 deg.C temperature error). The flexible operation temperature of a protecting circuit is set optionally to 0-500 deg.C and evil thermal influence on the whole system is reduced.
申请公布号 JPS58141026(A) 申请公布日期 1983.08.22
申请号 JP19820023212 申请日期 1982.02.16
申请人 NIPPON DENKI KK 发明人 TATEBAYASHI YOSHIFUMI
分类号 G01R19/32;G01K7/01;G01K7/24;H03K5/08 主分类号 G01R19/32
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